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KMID : 0381920140440040133
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Korean Journal of Microscopy
2014 Volume.44 No. 4 p.133 ~ p.137
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Transmission Electron Microscopy Specimen Preparation for Layer-area Graphene by a Direct Transfer Method
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Cho Young-ji
Yang Jun-Mo
Lam Do-Van
Lee Seung-Mo
Kim Jae-Hyun
Han Kwan-Young
Chang Ji-ho
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Abstract
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We suggest a facile transmission electron microscopy (TEM) specimen preparation method for the direct (polymer-free) transfer of layer-area graphene from Cu substrates to a TEM grid. The standard (polymer-based) method and direct transfer method were by TEM, high-resolution TEM, and energy dispersive X-ray spectroscopy (EDS). The folds and crystalline particles were formed in a graphene specimen by the standard method, while the graphene specimen by the direct method with a new etchant solution exhibited clean and full coverage of the graphene surface, which reduced several wet chemical steps and accompanying mechanical stresses and avoided formation of the oxide metal.
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KEYWORD
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Graphene, Transmission electron microscopy, Specimen preparation
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